Testablility method for embedded core - based integrated circuits 嵌入式基于芯片的集成电路的可试性方法
Standard testability method for embedded core - based integrated circuits c tt 嵌入式基于芯片的集成电路c tt的标准可试性方法
In this paper , we investigate the problem of soc test and introduce embedded core test international standard ieee p1500 本文对soc的测试问题进行了初步研究,并介绍了嵌入式核测试标准ieeep1500 。
The result shows that forming a high capability ac control ic using this ip as an embedded core with other cpu or dsp core can efficiently shorten the cpu processing time and constitute high performance close - loop control system . some of the ips about the communication between d / a convert , i2c devices and control ics are also created 这种速度估算ip核作为一种通用的片内外设形式(以硬件形式完成软件功能) ,和裸mcu (或dsp )核制成电机控制专用芯片,可应用于各种无速度传感器的电机控制场合。